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REFLECTRON RFT50




RFT50 tof spectrometer with ion source for laser / electron impact ionisation
RFT50 tof spectrometer with ion source for laser / electron impact ionisation

REFLECTRON RFT50 neapel-gesamt (Napoli)
Reflectron RFT50 with electron impact ionisation, ion source mounted on flange opposite to the reflectron mounting flange, second detector with 20 kV post-acceleration behind the ion mirror


Our Model RFT50 time-of-flight mass spectrometer is optimized for mass analysis of ions with mass > 100 000 amu. It uses a detector with 20 kV post-acceleration for efficient heavy-particle detection. The spectrometer can be equipped with different ion sources depending on the ionisation scheme employed:
  • electron impact ionization of gas phase species
  • laser ionisation, VUV ionisation,
  • laser desorption and ablation from solid and liquid surfaces and small particles (aerosols, soot)
  • sputtering of surfaces (SIMS)

Features:
  • two-stage ion mirror
  • large two-stage channelplate detector (40 mm diameter) with 20 kV post-acceleration for efficient heavy-particle dtection
  • time resolution T/ΔT up to 10 000 (mass 130)
  • electron impact ionisation with magnetically guided electron beam, sweep rate up to 10 kHz
  • MS-Windows based software package for menu-driven spectrometer operation (electron impact ionisation)
  • UHV-compatible setup, (O-ring sealed flanges on request)

Geometrical Data
  • overall length ca.  950 mm
  • (folded) field-free drift space ca. 1000 mm
  • connection flange CF150 (8"CF o.d.) or CF100 (6"CF o.d.)
  • flight tube (diameter 200 mm) with pump flange CF100 (6 "CF o.d.) and pressure gauge flange CF40 ( 2.75"CF o.d.)
  • distance connection flange - ionisation zone from 100 to 300 mm

Options:
  • mass analysis of negative ions
  • detector with extended dynamic range to avoid detector saturation by intense mass peaks or high sweep rate
  • three-stage mcp detector for low-signal mesurements
  • additional detector behind the ion mirror
  • parallel-wire ion gate to remove unwanted ionic species from the extracted ion beam, located in the Wiley-McLaren time focus of the two-stage ion source

Ion sources available:
for electron impact ionisation, laser ionisation, laser desorption and laser ablation, aerosol spectroscopy


Examples for RFT50 ion sources:


RFT50
Ion source for electron impact ionisation, magnetically-guided
electron beam


 

RFT50
Ion source for cluster size analysis employing alternatively laser
ionisation or electron impact ionisation
 


REFLECTRON RFT50 tokyo-iq
Ion source for laser ionisation of heavy clusters, travelling orthogonally  to the tof axis


 
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